The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2010

Filed:

May. 19, 2008
Applicant:

Chia-chi Hsu, Taoyuan County, TW;

Inventor:

Chia-Chi Hsu, Taoyuan County, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A circuit in probe card, which includes a signal line, a detection probe and a plurality of switch modules. A plurality of test response signals form a plurality of chips to be tested are transmitted on the signal line. The detection probe is coupled to the signal line for receiving the test response signals from the tested chips. In addition, each of the switch modules is respectively coupled to the signal line and the probes to selectively transmit the test response signals from the chips to the signal line such that the chips are able to be tested without disruption caused by an electrical short.


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Hsu, Chia-Chi. (2010). Chip test apparatus and probe card circuit (U.S. Patent No. 7812625). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7812625

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