The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2010

Filed:

Oct. 24, 2006
Applicant:

William George Doyen, Annapolis, MD (US);

Inventor:

William George Doyen, Annapolis, MD (US);

Assignee:

Arinc Incorporated, Annapolis, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method to detect changes in composite structures using RF signal pattern data interpretation. An RF signal is transmitted from a composite material manufactured structure and a plurality of sensors are employed to measure the RF signal. The measured RF signal is compared to a stored baseline RF signal for the particular structure. Deviations in the measured RF pattern for the structure, or for a structurally-similar composite structure, are automatically analyzed to detect non-visually-detectable defects or other changes in the composite structure. A baseline RF signature is developed for a structure by transmitting a reference RF signal from the composite structure. RF signals are detected by a variety of methods, and the detected signals are compiled and translated into reference and/or test RF signal patterns for the structure.


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