The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
Jun. 28, 2007
Applicants:
Raanan A. Miller, Chestnut Hill, MA (US);
Erkinjon G. Nazarov, Lexington, MA (US);
Paul Vouros, Concord, MA (US);
Inventors:
Raanan A. Miller, Chestnut Hill, MA (US);
Erkinjon G. Nazarov, Lexington, MA (US);
Paul Vouros, Concord, MA (US);
Assignees:
Sionex Corporation, Bedford, MA (US);
Northeastern University, Boston, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention relates generally to systems, methods and devices for analyzing samples and, more particularly, to systems using tandem differential mobility spectrometers in combination with a mass analyzer to enhance the analysis process of constituents of a sample.
Quick Actions:
Miller, Raanan. (2010). Tandem differential mobility spectrometers and mass spectrometer for enhanced analysis (U.S. Patent No. 7812305). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7812305
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile