The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
Jul. 05, 2007
Elisabeth C. A. Brot, Albany, NY (US);
Daniel K. Keefe, Jr., Troy, NY (US);
Brian P. Haney, Rensselaer, NY (US);
Nigel Metcalfe, Rensselaer, NY (US);
Grant J. Palmer, Clifton Park, NY (US);
Paul K. Isbester, Castleton, NY (US);
Elisabeth C. A. Brot, Albany, NY (US);
Daniel K. Keefe, Jr., Troy, NY (US);
Brian P. Haney, Rensselaer, NY (US);
Nigel Metcalfe, Rensselaer, NY (US);
Grant J. Palmer, Clifton Park, NY (US);
Paul K. Isbester, Castleton, NY (US);
CeNeRx BioPharma, Inc., Cary, NC (US);
Abstract
Provided herein is a new form of 3-fluoro-7-(2,2,2-trifluoroethoxy)phenoxathin 10,10-dioxide, which demonstrates higher stability relative to other forms of 3-fluoro-7-(2,2,2-trifluoroethoxy)phenoxathiin-10,10-dioxide. In particular, this new form affords less dosage critical administration of 3-fluoro-7-(2,2,2-trifluoroethoxy)phenoxathin 10,10-dioxide relative to other forms. The new solid form of 3-fluoro-7-(2,2,2-trifluoroethoxy)phenoxathiin-10,10-dioxide has been determined and is provided herein. This new solid form of 3-fluoro-7-(2,2,2-trifluoroethoxy)phenoxathiin-10,10-dioxide can be characterized by any of a number of its properties, including, but not limited to, melting point, differential scanning calorimetry, infrared spectroscopic spectrum or portions thereof, solubility, methods and conditions under which this form is prepared, and/or precipitated from solution, and, when in crystalline form, the crystalline form can be characterized according to the diffraction pattern or portions thereof.