The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2010

Filed:

Jul. 22, 2008
Applicant:

Myung-il Kang, Yongin-si, KR;

Inventor:

Myung-Il Kang, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/4763 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of manufacturing a metal line according to embodiments includes forming an interlayer dielectric layer over a semiconductor substrate. A dielectric layer is formed over the interlayer dielectric layer. A trench may be formed by etching the dielectric layer and the interlayer dielectric layer. A metal material may be disposed over the interlayer dielectric layer including the trench. A first planarization process may be performed on the metal material using the dielectric layer as an etch stop layer. A wet etch process may be performed on the semiconductor substrate subjected the first planarization process. A second planarization process may be performed on interlayer dielectric layer subjected to the wet etch process.


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