The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
Mar. 30, 2006
John Victor Lamont, Co. Antrim, IE;
Robert Ivan Mcconnell, Co. Antrim, IE;
Stephen Peter Fitzgerald, Co. Antrim, IE;
John Victor Lamont, Co. Antrim, IE;
Robert Ivan McConnell, Co. Antrim, IE;
Stephen Peter Fitzgerald, Co. Antrim, IE;
Randox Laboratories Limited, Crumlin, GB;
Abstract
A method of monitoring the properties of a biological or chemical sample. The method includes carrying out a plurality of different tests on the sample to generate corresponding test data; optionally carrying out a preliminary processing of the test data to generate partially processed data; storing the test data and/or partially processed data; causing a processing system to analyze a user-defined selection of the test data or partially processed data to generate result data relating to one or more properties of the sample; and subsequent to the previous step, receiving a second user defined selection of the test data or partially processed data, different from the first selection, and causing the processing system to analyze the second user-defined selection of the test data or partially processed data to generate second result data relating to one or more properties of the sample different from the properties corresponding to the first user-defined selection.