The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
Jul. 19, 2005
Takashi Shiga, Ehime, JP;
Takashi Shiga, Ehime, JP;
Panasonic Corporation, Osaka, JP;
Abstract
An analysis system includes an analyzing disk, and an analyzer. The analyzing disk includes a chamber into which a test sample is input. The test sample includes a first component and a second component. The analyzer includes a driving unit for rotating the analyzing disk so as to centrifuge the first component and the second component of the test sample from each other in the first chamber, an optical unit movable in a radial direction of the analyzing disk for illuminating light to the analyzing disk and detecting light from the test sample in the first chamber, and a controller for detecting, based on the light from the optical unit, a boundary between the first component and the second component centrifuged in the first chamber. This analysis system monitors the status of the separation due to the centrifugation, hence analyzing the test sample accurately.