The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
Jun. 14, 2007
Applicant:
John Chiu, Torrance, CA (US);
Inventor:
John Chiu, Torrance, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A lateral flow chromatography test device is disclosed that includes a stopping mechanism which enables a user of the test device to stop reactions of a test by pushing the stopping mechanism downward to remove materials flowing along a test strip in the test device at a time instructed by the manufacturer or decided by the user. This stopping mechanism is adapted to freeze the test result at the stopping time so as to keep the test result as a permanent record. The invention enables qualitative tests to become quantitative or semi-quantitative tests.