The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2010

Filed:

Jan. 30, 2008
Applicants:

Hongfeng Yin, Cupertino, CA (US);

Reid Brennen, San Francisco, CA (US);

Kevin Killeen, Woodside, CA (US);

Inventors:

Hongfeng Yin, Cupertino, CA (US);

Reid Brennen, San Francisco, CA (US);

Kevin Killeen, Woodside, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01D 15/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device for sample analysis includes a microfluidic device for separating analytes of a sample comprising a liquid, the microfluidic device comprising a substrate having a first surface and a second surface opposite the first surface, the substrate defining features that collectively occupy an area of the substrate of about 0.1 to 10 cm, the features comprising a sample input port located at the first surface; a drying agent input port located at the first surface; an enrichment column; a separation column; switching ports located at the second surface; and fluid-conducting passages extending through the substrate from the switching ports to the sample input port, the drying agent input port, the enrichment column and the separation column. Also provided are methods and systems for separating analytes from a sample.


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