The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2010
Filed:
Nov. 08, 2007
Gerard Antkowiak, Jena, DE;
Marco Hanft, Jena, DE;
Elke Ebert, Jena, DE;
Karsten Festag, Jena, DE;
Juergen Ledermann, Jena, DE;
Gerard Antkowiak, Jena, DE;
Marco Hanft, Jena, DE;
Elke Ebert, Jena, DE;
Karsten Festag, Jena, DE;
Juergen Ledermann, Jena, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A solution by which an examination of the cornea for possible encapsulations, air bubbles, or other irregularities following a refractive surgery can be carried out directly at the treatment device instead of the patient having to be transferred to an examination device. The additional slit illumination system includes two slit projector units substantially symmetrically mounted at an angle of about 40° to the optical axis of the refractive treatment device, and fixed and focused on the eye of the patient to be examined. The slit projector units include a light source, a projection optical system, and beam forming and/or conducting optical components. Although intended for surgical microscopes, it can also be used for other opthalmologic treatment devices that would benefit from a slit projection system for the examination before, during, or after the treatment procedure.