The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2010
Filed:
Sep. 29, 2004
Wolfgang Franz Eckl, Spardorf, DE;
Bernd Georg Friedel, Markt Bibart, DE;
Wolfgang Franz Eckl, Spardorf, DE;
Bernd Georg Friedel, Markt Bibart, DE;
Alcatel-Lucent USA Inc., Murray Hill, NJ (US);
Abstract
The present invention provides a method and an apparatus for assessing a capability, for example, linearity of an amplifier, such as that of a power amplifier including a radio frequency amplifier. In one embodiment, the method comprises defining a first figure of merit for a power amplifier based on a loss of linearity relative to a predefined linearity requirement for the power amplifier and/or defining a second figure of merit based on the first figure of merit and dependent upon a minimum frequency within a predefined frequency band for the power amplifier, characterizing the linearity thereof. In this manner, using a test setup, for digital mobile communication networks deploying one or more higher order modulation schemes with complex wireless transmission that results in non-constant envelope signals, linearity of power amplifiers in transceivers, such as a mobile station or a base station, may be sufficiently described. Moreover, the two defined figures of merit may be used to compare different amplifiers for these higher modulation schemes, making possible a comparison of different amplifiers independent of their implementation technology or design structure.