The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2010
Filed:
Sep. 27, 2007
Applicant:
Han-soo Seong, Yongin-si, KR;
Inventor:
Han-Soo Seong, Yongin-si, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system and method of generating a test clock signal for scan testing of a main circuit in a semiconductor device includes receiving an external clock signal and a control signal and generating a gated clock signal by gating an internal clock signal based on the control signal. The internal clock signal has a frequency higher than a frequency of the external clock signal. One of the external clock signal and the gated clock signal is selectively output based on the control signal.