The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2010
Filed:
Jul. 27, 2007
System and method using differential loop gain for fault identification in line monitoring equipment
Applicants:
Hongbin Zhang, Marlboro, NJ (US);
Ralph Brian Jander, Freehold, NJ (US);
Inventors:
Hongbin Zhang, Marlboro, NJ (US);
Ralph Brian Jander, Freehold, NJ (US);
Assignee:
Tyco Electronics Subsea Communications LLC, Morristown, NJ (US);
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system and method using differential loop gain for fault analysis in line monitoring equipment. Differential loop gain data is calculated from loop gain data, and fault analysis is conducted using differential loop gain data, e.g. by comparing the differential loop gain data to predefined fault signatures.