The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2010
Filed:
Sep. 06, 2006
Rajesh Kumar Singh, Deerfield Township, OH (US);
Thomas Keith Olschner, West Chester, OH (US);
Ian James Semple, Kingston, CA;
Paul Anthony Powell, Belleville, CA;
Jeremy Georges Bertin, Fredericton, CA;
Rajesh Kumar Singh, Deerfield Township, OH (US);
Thomas Keith Olschner, West Chester, OH (US);
Ian James Semple, Kingston, CA;
Paul Anthony Powell, Belleville, CA;
Jeremy Georges Bertin, Fredericton, CA;
The Procter & Gamble Company, Cincinnati, OH (US);
Abstract
A process is provided for inspecting an absorbent article constructed from multiple components. A filtered image is produced from the absorbent article. In the image of the absorbent article, a nonlinear first edge and a second edge are identified at a location where there is a course change in contrast. A center point and centerline of the absorbent article is calculated using the position of the first edge and the second edge. A skew of the absorbent article is calculated. These known locations are utilized to define at least one additional region of the image for further analysis. A third edge and fourth edge are identified at a location where there is a fine change in contrast. The skew of the third edge and the fourth edge within the defined region is calculated and compared to known parameters for the absorbent article.