The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2010
Filed:
Aug. 10, 2006
Applicant:
Vir V. Phoha, Ruston, LA (US);
Inventor:
Vir V. Phoha, Ruston, LA (US);
Assignee:
Louisiana Tech University Foundation, Inc., Ruston, LA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06F 21/00 (2006.01); G10L 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
At least two biometric measurements of a person are collected, then a statistical measure based on the measurements is computed. The statistical measure is a bounded estimate of the discriminative power of a test based on the measurements. While the discriminative power is less than a target value, additional biometric measurements are collected. When enough measurements have been collected, a biometric template is constructed from the measurements and stored for use in future identifications. Systems and software to implement similar methods are also described and claimed.