The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7809113 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 05, 2010

Filed:

Oct. 05, 2007
Applicants:

Nobutada Aoki, Otawara, JP;

Akiko Kakutani, Yokohama, JP;

Inventors:

Nobutada Aoki, Otawara, JP;

Akiko Kakutani, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 35/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to an X-ray source for emitting a characteristic X-ray and a fluorescent X-ray analyzing apparatus using the X-ray source. A secondary target is arranged in superposition on a primary target. An electron beam generated by an electron gun enters the primary target, which passes and emits a continuous X-ray. The secondary target transmits and emits a characteristic X-ray excited by the continuous X-ray emitted from the primary target. The primary target and the secondary target are superposed one on the other, so that the continuous X-ray emitted from the primary target efficiently excites the secondary target thereby to efficiently generate the characteristic X-ray.


Find Patent Forward Citations

Aoki, Nobutada. (2010). X-ray source and fluorescent x-ray analyzing apparatus (U.S. Patent No. 7809113). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7809113

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