The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2010
Filed:
Mar. 20, 2008
Hideo Hirukawa, Musashino, JP;
Mikiharu Kuwata, Musashino, JP;
Hideo Hirukawa, Musashino, JP;
Mikiharu Kuwata, Musashino, JP;
Yokogawa Electric Corporation, Tokyo, JP;
Abstract
A confocal microscope system capable of observing a bright field image and a fluorescent image together with a confocal image can be achieved with a simple configuration. The confocal microscope system may include a confocal scanner unit having a microlens array disc and a pin hole array disc, for scanning a face of the observation sample by a plurality of beam spots, a relay lens connected to a camera for acquiring observed images; a microscope for holding the observation sample and illuminating an observation light for observing the bright field image and an excitation light for observing the fluorescent image on the observation sample, and having a port part for outputting the observation light acquired from the observation sample to the confocal scanner unit; and a detour light path unit selectively inserted between the port part of the microscope and the confocal scanner unit.