The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2010
Filed:
Jul. 23, 2008
Masahito Kon, Kanagawa, JP;
Kayoko Taniguchi, Kanagawa, JP;
Hideaki Tamiya, Kanagawa, JP;
Yasuhiko Onodera, Kanagawa, JP;
Hideki Tsuchiya, Kanagawa, JP;
Akihiro Kuroda, Tokyo, JP;
Masahito Kon, Kanagawa, JP;
Kayoko Taniguchi, Kanagawa, JP;
Hideaki Tamiya, Kanagawa, JP;
Yasuhiko Onodera, Kanagawa, JP;
Hideki Tsuchiya, Kanagawa, JP;
Akihiro Kuroda, Tokyo, JP;
Mori Seiki Co., Ltd., Nara, JP;
Abstract
Disclosed is a displacement measuring apparatus that includes a composite scale having a magnetic pattern and a diffraction grating each aligned in a direction of measuring axis, and a detector head moving in a direction of measuring axis relative to the composite scale. The detector head has a magnetic detection unit detecting a magnetic field exerted by the magnetic pattern to generate first reproduced signals, a light source irradiating the diffraction grating with light, and an optical detection unit detecting the light diffracted by the diffraction grating to generate second reproduced signals. In composite scale, the magnetic pattern and the diffraction grating are arranged such that a pitch of the first reproduced signals is larger than that of the second reproduced signals.