The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2010
Filed:
Dec. 11, 2008
Jae Ho Shin, Gyeonggi-do, KR;
Jae Ho Shin, Gyeonggi-do, KR;
LG Display Co., Ltd., Seoul, KR;
Abstract
An inspection apparatus and inspection method for liquid crystal display devices are disclosed, wherein a final inspection for completely manufactured liquid crystal display devices is performed using a visual-light inspection apparatus, whereby high productivity due to improved inspection accuracy and reduced inspection time can be accomplished. With the inspection apparatus and inspection method, defects of a plurality of glass panels can be automatically inspected based on analyzed information of an entire screen of each glass panel using a plurality of vision cameras, whereby improved inspection accuracy and improved product quality can be accomplished and reduced inspection time can result in improved productivity of liquid crystal display devices. Further, by quantifying screen defects of the plurality of glass panels, defects of glass panels due to failures of manufacturing processes or design failures and other problems attendant on the defects can be prevented.