The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2010
Filed:
Jul. 26, 2007
Hong Woo Lee, Cheonan, KR;
Myung Koo Hur, Cheonan, KR;
Jong Hwan Lee, Anyang, KR;
Sung Man Kim, Seoul, KR;
Jong Hyuk Lee, Seoul, KR;
Hong Woo Lee, Cheonan, KR;
Myung Koo Hur, Cheonan, KR;
Jong Hwan Lee, Anyang, KR;
Sung Man Kim, Seoul, KR;
Jong Hyuk Lee, Seoul, KR;
Abstract
The present invention relates to a module and method for detecting a defect of a thin film transistor (TFT) substrate, which can detect disconnection of a gate line of the TFT substrate having gate drivers provided with a dual structure in which the gate drivers are provided at both sides of the gate lines. There is provided a module and method for detecting a defect of a TFT substrate, wherein gate lines are separated into two portions by cutting a central region of the gate lines, gate power is supplied to the gate lines of which central portions are cut through gate drivers provided at both sides of the gate lines, and a signal of a negative voltage level is supplied to data lines, so that disconnection of the gate lines can be detected.