The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2010
Filed:
Mar. 27, 2008
Toshifumi Mihashi, Tokyo, JP;
Yoko Hirohara, Tokyo, JP;
Mariko Kobayashi, Tokyo, JP;
Topcon Corporation, Tokyo, JP;
Abstract
An eye examination apparatusof the present invention comprises, a refractive power measuring sectionfor measuring refractive powers of subject eyes E of a subject in a binocular viewing state, an eye chart presenting sectionfor presenting a subjective measurement eye chart to be observed by the subject, a correcting sectionfor correcting the subject eyes by referring to data on the refractive powers measured with the refractive power measuring sectionand using the subjective measurement eye chart presented in the eye chart presenting sectionand an optical characteristics measuring sectionfor subjectively measuring an optical characteristic of the subject eyes E corrected or being corrected with the correcting sectionin a state where the subject is binocularly viewing the subjective measurement eye chart.