The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2010
Filed:
Jan. 08, 2007
Martin Hirzel, White Plains, NY (US);
Chengliang Zhang, Rochester, NY (US);
Martin Hirzel, White Plains, NY (US);
Chengliang Zhang, Rochester, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Disclosed are a method and system for finding an optimal data layout. The approach of the present invention is to try one of several data layouts in the memory, measure the impact of said one data layout on a performance of a program, and decide which of said several data layouts to try next. The trying and measuring steps are repeated, and one of said several data layouts is selected as best or optimal based on the measurings. The preferred embodiment of the invention provides layout auditing, a framework for picking the best data layout online without requiring any user input. Layout auditing optimizes data layouts with a try-measure-decide feedback loop: use a data reorganizer to try one of several data layouts, use a profiler to measure the impact of the data layout on performance, and use a controller to decide which data layout to try next.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile