The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2010
Filed:
Nov. 14, 2005
Applicant:
James Todhunter, Framingham, MA (US);
Inventor:
James Todhunter, Framingham, MA (US);
Assignee:
Invention Machine Corporation, Boston, MA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
Problem analysis system, given either half of a cause-effect relationship, automatically formulates a natural language or Boolean query that is automatically submitted via a knowledge search tool to a database of cause-effect relationships, and responses to this query from the database are automatically provided.
Todhunter, James. (2010). System and method for problem analysis (U.S. Patent No. 7805455). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7805455
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile