The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2010
Filed:
Jan. 20, 2006
Arnd Christian Konig, Redmond, WA (US);
Shubha Umesh Nabar, Stanford, CA (US);
Arnd Christian Konig, Redmond, WA (US);
Shubha Umesh Nabar, Stanford, CA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
To determine a configuration for a database system, a plurality of queries may be sampled from a representative workload using statistical inference to compute the probability of correctly selecting one of a plurality of evaluation configurations. The probability of correctly selecting may determine which and/or how many queries to sample, and/or may be compared to a target probability threshold to determine if more queries must be sampled. The configuration from the plurality of configurations with the lowest estimated cost of executing the representative workload may be determined based on the probability of selecting correctly. Estimator variance may be reduced through a stratified sampling scheme that leverages commonality, such as an average cost of execution, between queries based on query templates. The applicability of the Central Limit Theorem may be verified and used to determine which and/or how many queries to sample.