The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7805438 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 28, 2010

Filed:

Jul. 31, 2006
Applicants:

Tie-yan Liu, Beijing, CN;

Ming-feng Tsai, Taipei, TW;

Wei-ying MA, Beijing, CN;

Inventors:

Tie-Yan Liu, Beijing, CN;

Ming-Feng Tsai, Taipei, TW;

Wei-Ying Ma, Beijing, CN;

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01); G06F 15/18 (2006.01); G06F 3/00 (2006.01); G01N 33/48 (2006.01); G01N 33/50 (2006.01); G05B 15/00 (2006.01); G05B 19/42 (2006.01); G06E 1/00 (2006.01); G06E 3/00 (2006.01); G06G 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for generating a ranking function using a fidelity-based loss between a target probability and a model probability for a pair of documents is provided. A fidelity ranking system generates a fidelity ranking function that ranks the relevance of documents to queries. The fidelity ranking system operates to minimize a fidelity loss between pairs of documents of training data. The fidelity loss may be derived from 'fidelity' as used in the field of quantum physics. The fidelity ranking system may use a learning technique in conjunction with a fidelity loss when generating the ranking function. After the fidelity ranking system generates the fidelity ranking function, it uses the fidelity ranking function to rank the relevance of documents to queries.


Find Patent Forward Citations

Liu, Tie-Yan. (2010). Learning a document ranking function using fidelity-based error measurements (U.S. Patent No. 7805438). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7805438

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