The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2010

Filed:

May. 13, 2005
Applicants:

Akihiko Namba, Osaka, JP;

Tetsuyoshi Ogura, Osaka, JP;

Toru Yamada, Osaka, JP;

Inventors:

Akihiko Namba, Osaka, JP;

Tetsuyoshi Ogura, Osaka, JP;

Toru Yamada, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for measuring electric circuit parameters of a 2-terminal circuit having first and second terminals, includes steps of: terminating one of the first and second terminals with a terminal impedance Z, to measure reflection characteristics αfor the other terminal; terminating one of the first and second terminals with a terminal impedance Zdifferent from the terminal impedance Z, to measure reflection characteristics αfor the other terminal; terminating one of the first and second terminals with a terminal impedance Zdifferent from the terminal impedances Zand Z, to measure reflection characteristics αfor the other terminal; and calculating electric circuit parameters of the 2-terminal circuit based on the resultant reflection characteristics αand α, whereby measuring electric circuit parameters, such as S-parameters, Z-parameters or the like, even of a DUT having a weak ground, in a simple way with high accuracy and low cost.


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