The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2010
Filed:
Jan. 12, 2007
Applicant:
Akio Furuse, Tokyo, JP;
Inventor:
Akio Furuse, Tokyo, JP;
Assignee:
Cosmo Instruments Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/28 (2006.01); G01M 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for detecting an operation malfunction of a leakage inspector causes the leakage inspector to execute a calibration process and an inspection process. The calibration process seals air inside a first device serving as a reference device and measures changes in pressure over two time intervals. The inspection process seals air inside a second device to be checked for a leak and measures changes in pressure over two time intervals. A ratio is calculated from these measured changes in pressure and the ratio is used to determine whether an operation malfunction occurs in the leakage inspector.