The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2010

Filed:

Feb. 28, 2007
Applicants:

Shi Han, Beijing, CN;

Yu Zou, Beijing, CN;

Ming Chang, Beijing, CN;

Peng Liu, Beijing, CN;

Yi-jian Wu, Beijing, CN;

Lei MA, Beijing, CN;

Frank Soong, Beijing, CN;

Dongmei Zhang, Bellevue, WA (US);

Jian Wang, Beijing, CN;

Inventors:

Shi Han, Beijing, CN;

Yu Zou, Beijing, CN;

Ming Chang, Beijing, CN;

Peng Liu, Beijing, CN;

Yi-Jian Wu, Beijing, CN;

Lei Ma, Beijing, CN;

Frank Soong, Beijing, CN;

Dongmei Zhang, Bellevue, WA (US);

Jian Wang, Beijing, CN;

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

Exemplary techniques are described for selecting radical sets for use in probabilistic East Asian character recognition algorithms. An exemplary technique includes applying a decomposition rule to each East Asian character of the set to generate a progressive splitting graph where the progressive splitting graph comprises radicals as nodes, formulating an optimization problem to find an optimal set of radicals to represent the set of East Asian characters using maximum likelihood and minimum description length and solving the optimization problem for the optimal set of radicals. Another exemplary technique includes selecting an optimal set of radicals by using a general function that characterizes a radical with respect to other East Asian characters and a complex function that characterizes complexity of a radical.


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