The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2010
Filed:
Sep. 01, 2005
Ihar Volkau, Singapore, SG;
Wieslaw Lucjan Nowinski, Singapore, SG;
Ihar Volkau, Singapore, SG;
Wieslaw Lucjan Nowinski, Singapore, SG;
Agency for Science, Technology and Research, Singapore, SG;
Abstract
A method for determining asymmetry in an image such as an MR image of a brain comprises determining a symmetry plane to divide the image into a first part and a second part representative of, for example, the hemispheres of the brain. The probability distributions of voxels against intensities are determined for the first and second parts and histograms of intensities representative of the parts are generated. Compensation is made for any relative shift along a predetermined axis between the histograms. A divergence value based on a distance between the first and second histograms is then calculated and it is determined if the calculated divergence value is greater than a predetermined threshold. A divergence of greater than the predetermined threshold is indicative of asymmetry in the image that may be considered as suspicious for abnormality. There is also disclosed an apparatus for determining asymmetry in an image.