The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2010
Filed:
May. 16, 2006
Nobuyuki Nagasawa, Hino, JP;
Masahiro Oba, Hino, JP;
Tetsuya Koike, Komagane, JP;
Yoshihisa Tanikawa, Tokyo, JP;
Yujin Arai, Tokyo, JP;
Nobuyuki Nagasawa, Hino, JP;
Masahiro Oba, Hino, JP;
Tetsuya Koike, Komagane, JP;
Yoshihisa Tanikawa, Tokyo, JP;
Yujin Arai, Tokyo, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A scanning examination apparatusis provided, the apparatus including a detachable objective lensor, a scannerfor two-dimensionally scanning light F from a specimenfocused by the objective lensor, a scanner control devicefor controlling the operation of the scanner, and an optical detectorfor detecting light scanned by the scanner, wherein the scanner control devicechanges the scanning direction of the light F depending on an image formation mode of the light F at the objective lensorwhich is attached.