The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2010
Filed:
Mar. 06, 2008
Ing-shouh Hwang, Taipei, TW;
En-te Hwu, Taipei, TW;
Kuang-yuh Huang, Taipei, TW;
Academia Sinica, Taipei, TW;
Abstract
The present invention provides an optical multi-axis linear displacement measurement system and a method thereof, and the system can detect the reflected light from the top surface of the object so as to obtain multi-axis linear displacements of the object. The optical multi-axis linear displacement measurement system utilizes a non-contact optical method for obtaining multi-axis linear displacements of the object and it can perform simultaneous multi-axis linear displacement measurements. The advantages of the system and method include: high response speed (bandwidth) for dynamic measurement, simple structure, cost effective, and high sensitivity for displacement measurements.