The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2010

Filed:

Sep. 09, 2003
Applicants:

GE Zhu, Shanghai, CN;

Edward Chen, Shanghai, CN;

Henry Haojan Tung, San Jose, CA (US);

Inventors:

Ge Zhu, Shanghai, CN;

Edward Chen, Shanghai, CN;

Henry Haojan Tung, San Jose, CA (US);

Assignee:

Huaya Microelectronics, Ltd., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/14 (2006.01); H04N 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for performing still pixel detection is presented. In accordance with the present invention, still pixel detection can use multiple thresholds and multiple windows of pixels. In a particular embodiment of the present invention, a still pixel detection test is performed using a first window. If the first window test determines the pixel is a still pixel then the pixel is classified as a still pixel. If the first window test determines the pixel is not a still pixel, a still pixel detection test is performed using a second window. If the second window test determines the pixel is a still pixel then the pixel is classified as a still pixel. Otherwise, the pixel is not classified as a still pixel. Some embodiment of the present invention the still pixel tests use multiple thresholds to determine if a pixel is a still pixel.


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