The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2010
Filed:
Aug. 19, 2008
Stephen John Sleijpen, Balmain, AU;
William John Stacey, Balmain, AU;
Julian Paul Kolodko, Balmain, AU;
Neil Fyfe Edwards, Balmain, AU;
Neil Mcalpin, Balmain, AU;
Eric Patrick O'donnell, Balmain, AU;
John Robert Sheahan, Balmain, AU;
Jason Mark Thelander, Balmain, AU;
Stephen John Sleijpen, Balmain, AU;
William John Stacey, Balmain, AU;
Julian Paul Kolodko, Balmain, AU;
Neil Fyfe Edwards, Balmain, AU;
Neil McAlpin, Balmain, AU;
Eric Patrick O'Donnell, Balmain, AU;
John Robert Sheahan, Balmain, AU;
Jason Mark Thelander, Balmain, AU;
Silverbrook Research Pty Ltd, Balmain, New South Wales, AU;
Abstract
A method for testing integrated circuits mounted on a carrier includes the step of securing the carrier. The carrier is displaced into an operative position in which the integrated circuits are in physical and electrical communication with a diagnostic probe. Test signals are generated in test circuitry in electrical communication with the diagnostic probe and communicated to the integrated circuits with the diagnostic probe. The test signals are received at the test circuitry via the diagnostic probe. The test signals are made available to a controller via a communications link and an automated server and displayed with the controller.