The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2010

Filed:

Feb. 12, 2007
Applicants:

Seung H. Kang, Sinking Spring, PA (US);

Lisa E. Mullin, Pottsville, PA (US);

Subramanian Karthikeyan, Schnecksville, PA (US);

Sailesh M. Merchant, Macungie, PA (US);

Inventors:

Seung H. Kang, Sinking Spring, PA (US);

Lisa E. Mullin, Pottsville, PA (US);

Subramanian Karthikeyan, Schnecksville, PA (US);

Sailesh M. Merchant, Macungie, PA (US);

Assignee:

Agere Systems Inc., Allentown, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/319 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor test device includes a test circuit having contacts for applying an electrical signal and measuring electrical parameters of the test circuit. The semiconductor test device also includes an integrally formed heating circuit comprising at least one circuit meander positioned adjacent the test circuit for raising a temperature within a portion of the test circuit.


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