The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2010
Filed:
Sep. 30, 2003
Applicants:
Trudee Klautky, Shrewsbury, MA (US);
Daniel Lapen, Lancaster, MA (US);
Inventors:
Trudee Klautky, Shrewsbury, MA (US);
Daniel Lapen, Lancaster, MA (US);
Assignee:
CYTYC Corporation, Marlborough, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
An automated method for classifying a cytological sample is provided. The method comprises interrogating the sample with one or more wavelengths of light to obtain a result, and then attaching one or more designators to the sample based on whether the result meets a given criterion. The method allows for rapid feedback on the characteristics of the sample, permitting automated designation of the sample as positive for a given characteristic, and allowing for immediate remedial actions if the sample fails to meet the criterion.