The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2010

Filed:

Jan. 19, 2006
Applicants:

Soo-hyung Choi, Hwaseong-si, KR;

Jang-seok MA, Seongnam-si, KR;

Joon-shik Park, Yongin-si, KR;

Ji-young OH, Suwon-si, KR;

Jong-suk Chung, Suwon-si, KR;

Inventors:

Soo-hyung Choi, Hwaseong-si, KR;

Jang-seok Ma, Seongnam-si, KR;

Joon-shik Park, Yongin-si, KR;

Ji-young Oh, Suwon-si, KR;

Jong-suk Chung, Suwon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12P 19/34 (2006.01); C12Q 1/68 (2006.01); C07H 21/02 (2006.01); C07H 21/04 (2006.01); C07H 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of increasing discrimination for a target DNA having a polymorphic site is provided. The method comprising immobilizing first and second probes on a substrate; hybridizing the immobilized first and second probes with first and second hurdle DNAs, respectively; and hybridizing the target DNA with the hybrids, and determining the ratio of a signal of the target DNA hybridized to the first probe to a signal of the target DNA hybridized to the second probe. The addition of a hurdle DNA and variation of a probe base can improve an ability of discriminating a single base mismatch.


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