The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2010

Filed:

May. 11, 2007
Applicants:

Peter Miller, New London, CT (US);

Andrew M. Leach, Clifton Park, NY (US);

Eric Telfeyan, Guilderland, NY (US);

David B. Whitt, Albany, NY (US);

Inventors:

Peter Miller, New London, CT (US);

Andrew M. Leach, Clifton Park, NY (US);

Eric Telfeyan, Guilderland, NY (US);

David B. Whitt, Albany, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A quality control system for measuring parameters in a pharmaceutical product includes a receiver vessel to receive a pharmaceutical product therein. The quality control system also includes a sample tube having a first end attached to the receiver vessel to remove pharmaceutical product from the receiver vessel and an appendage connected to a second end of the sample tube. The appendage includes at least one chamber therein to receive a quantity of pharmaceutical product from the receiver vessel. A valve positioned within the sample tube controls flow of the pharmaceutical product to the appendage and prevents flow of the pharmaceutical product from the appendage back into the receiver vessel. The system also includes a quality control device configured to measure at least one parameter of the pharmaceutical product in at least one of the receiver vessel and the appendage.


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