The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2010
Filed:
Jul. 16, 2007
Lihong Pan, Brookfield, WI (US);
Michael Joseph Washburn, Brookfield, WI (US);
Kirstin Nora Laconte, Waukesha, WI (US);
Lihong Pan, Brookfield, WI (US);
Michael Joseph Washburn, Brookfield, WI (US);
Kirstin Nora LaConte, Waukesha, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for measuring a non-linear response from a target using an imaging apparatus includes transmitting a signal towards a region of interest from a transducer at a first amplitude and measuring a first response thereto, and transmitting, from the transducer towards the region of interest, at least one additional signal of the same phase as the first amplitude signal but at one or more different, lower amplitudes and measuring at least one additional response thereto. A difference of a function of the measured additional response or responses from the first response is determined, thereby obtaining a non-linear response of the object of interest, and a representation of the non-linear response is displayed.