The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2010

Filed:

Jun. 21, 2005
Applicant:

Naoki Yamada, Nasushiobara, JP;

Inventor:

Naoki Yamada, Nasushiobara, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An X-ray diagnostic imaging method, comprises the steps of radiographing the predetermined area so that an image data of a first contrast image is acquired when a timing of an acquired start of the first contrast image comes, after an injection of the contrast medium into the affected part, and radiographing the predetermined area so that image data of a second contrast image is acquired when a timing of an acquired start of the second contrast image comes, after the image data of the first contrast image is acquired.


Find Patent Forward Citations

Yamada, Naoki. (2010). X-ray diagnostic imaging system and x-ray diagnostic imaging method (U.S. Patent No. 7801588). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7801588

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