The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2010
Filed:
Dec. 18, 2006
James J. Jaklitsch, Parkton, MD (US);
Jay Markey, York, PA (US);
Thomas P. Mcgrath, Lutherville, MD (US);
James J. Jaklitsch, Parkton, MD (US);
Jay Markey, York, PA (US);
Thomas P. McGrath, Lutherville, MD (US);
AAI Corporation, Hunt Valley, MD (US);
Abstract
A method of providing an integrated approach to automated system alignment is set forth, which may include in an exemplary embodiment: providing amplifier compression alignment, (which may include characterizing and/or compensating for a parasitic effect); providing continuous internal alignment of phase and amplitude of a synthetic stimulus instrument (SSI) output signal; providing external measurement port alignment; and providing transfer alignment of internal measurement paths. According to another exemplary embodiment, a receiver apparatus may include: a dual-channel coherent measurement receiver which may include at least one internal channel operative to measure time-division-multiplexed (TDM) feedback signals from each signal source of a synthetic stimulus instrument (SSI); and at least one external channel operative to make direct measurement at an external alignment port output.