The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2010
Filed:
Jul. 06, 2009
Nephi Mourik, Provo, UT (US);
Ronald K. Eyre, Orem, UT (US);
Nephi Mourik, Provo, UT (US);
Ronald K. Eyre, Orem, UT (US);
Smith International, Inc., Houston, TX (US);
Abstract
Methods for nondestructively measuring a characteristic within an ultra-hard polycrystalline construction comprises projecting a beam of energy from an emitter onto the construction. The energy is directed to a target region within the ultra-hard polycrystalline construction and passes through the construction where it is received by a detector. The target region can be within a diamond body of the construction, and can relate to an interface between two or more regions within the diamond body. The energy that is received by the detector is evaluated for the purpose of determining the desired measurement characteristic. In an example embodiment, the measured characteristic can be the interface of between two or more regions and the distance from a surface of the construction to the interface. The method can be used to generate an average distance within the construction, and to provide a visual image of the same in a nondestructive manner.