The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2010
Filed:
Dec. 19, 2007
Xiaoye Wu, Rexford, NY (US);
James Walter Leblanc, Niskayuna, NY (US);
Paavana Sainath, Oconomowoc, WI (US);
Xiaoye Wu, Rexford, NY (US);
James Walter Leblanc, Niskayuna, NY (US);
Paavana Sainath, Oconomowoc, WI (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method for calibrating and reconstructing material density images in a dual-spectral computed tomography (CT) systemis disclosed. An X-ray source in the CT systememits a first X-ray spectrum and a second X-ray spectrum towards an object. The method includes computing calibration coefficients by using projection data from the object for the two X-ray spectra and by linearizing at least two basis materials such as bone and water simultaneously. Further, basis materials decomposition coefficients for the at least two basis materials are computed by linearizing the basis materials individually. Correction values for the projection data and for the basis materials are then computed by using the basis materials decomposition coefficients and the calibration coefficients. The computed correction values are used in reconstructing material density images for the basis materials.