The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2010
Filed:
Sep. 28, 2005
Applicant:
Alexander Julian Eglit, Half Moon Bay, CA (US);
Inventor:
Alexander Julian Eglit, Half Moon Bay, CA (US);
Assignee:
Genesis Microchip Inc, Santa Clara, CA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01); H03H 7/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
An over-sampled sequence detector operates on sampled data and tracks the detection reliability of the sampled data. The detector separately analyzes sample sequences for different sampling phases and then picks a sample sequence that allows for the most reliable detection. For the different sampling phases, the detector inspects some amount of look-behind and look-ahead information in order to improve upon simple symbol-by-symbol detection. The over-sampled information is used to further improve detection performance.