The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7800749 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 21, 2010

Filed:

May. 31, 2007
Applicants:

Philip Robert Leblanc, Corning, NY (US);

Douglas S Goodman, Pittsford, NY (US);

Inventors:

Philip Robert LeBlanc, Corning, NY (US);

Douglas S Goodman, Pittsford, NY (US);

Assignee:

Corning Incorporated, Corning, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for inspecting a transparent substrate provides an index-matching fluid between an index-matched optical coupler and a surface of the transparent substrate. The method repeats, at two or more positions along the surface of the transparent substrate, steps of illuminating an inspection volume within the transparent substrate by directing a ribbon of light through the optical coupler and into the transparent substrate and detecting scattered light from the inspection volume at a detector that is optically conjugate with the inspection volume.


Find Patent Forward Citations

LeBlanc, Philip. (2010). Inspection technique for transparent substrates (U.S. Patent No. 7800749). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7800749

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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