The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2010
Filed:
Aug. 13, 2007
Vadim Backman, Chicago, IL (US);
Yang Liu, Somerset, NJ (US);
Young Kim, West Lafayette, IN (US);
Hemant Roy, Highland Park, IL (US);
Michael Goldberg, Highland Park, IL (US);
Randall Brand, Highland Park, IL (US);
Prabhakar Pradhan, Evanston, IL (US);
Hariharan Subramanian, Chicago, IL (US);
Vadim Backman, Chicago, IL (US);
Yang Liu, Somerset, NJ (US);
Young Kim, West Lafayette, IN (US);
Hemant Roy, Highland Park, IL (US);
Michael Goldberg, Highland Park, IL (US);
Randall Brand, Highland Park, IL (US);
Prabhakar Pradhan, Evanston, IL (US);
Hariharan Subramanian, Chicago, IL (US);
Northwestern University, Evanston, IL (US);
NorthShore University HealthSystem, Evanston, IL (US);
Abstract
Systems and methods for identifying refractive-index fluctuations of a target are described in this application. One embodiment includes identifying one or more properties of emergent light, the emergent light to be emergent from a target, and determining refractive-index fluctuations of the target based on the one or more properties of the emergent light. The determining refractive-index fluctuations further comprises determining one or more of the variance of the refractive-index fluctuations and the spatial correlation length of the refractive-index fluctuations. The determining refractive-index fluctuations further comprises determining one or more of the variance of the refractive-index fluctuations and the spatial correlation length of the refractive-index fluctuations.