The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2010

Filed:

May. 11, 2007
Applicants:

Marcel Rohner, Heiden, CH;

Beat Aebischer, Heerbrugg, CH;

Thomas Jensen, Rorschach, CH;

Knut Siercks, St. Gallen, CH;

Inventors:

Marcel Rohner, Heiden, CH;

Beat Aebischer, Heerbrugg, CH;

Thomas Jensen, Rorschach, CH;

Knut Siercks, St. Gallen, CH;

Assignee:

Leica Geosystems AG, Heerbrugg, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A distance measuring method for detecting the spatial dimension of at least one target by at least one emission of a multiplicity of light pulses, in particular laser light, towards the target, detecting the light pulse scattered back by the target by means of a multiplicity of distance measuring pixels and eliminating the distance to the target for each pixel, wherein each light pulse can be detected within a measuring interval Ti from at least two partial intervals tij and the detection of at least one repetition constitutes a detection step performed in at least two stages wherein the measuring interval T˜ is shortened from stage to stage.


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