The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2010

Filed:

May. 13, 2004
Applicants:

Zeev Zalevsky, Rosh HaAyin, IL;

Jonathan Solomon, Herzelia, IL;

Inventors:

Zeev Zalevsky, Rosh HaAyin, IL;

Jonathan Solomon, Herzelia, IL;

Assignee:

Xceed Imaging Ltd., Rosh Haayin, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system are presented for imaging an object with image resolution for at least a part of the object exceeding by a predetermined factor a geometrical resolution defined by a detector pixel array. A predetermined aperture coding is applied to the wavefront of a light signal indicative of at least a part of the object to be imaged with the enhanced resolution, while propagating towards the detector pixel array. The aperture coding is predetermined in accordance with aliasing occurring in the detector plane and such as to provide orthogonality of spectral data indicative of a sampled output of the detector, to thereby enable using the aperture code to reconstruct the image of said at least part of the object with the resolution enhanced by said factor.


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