The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2010
Filed:
Jun. 16, 2006
Michael Harville, Palo Alto, CA (US);
Irwin E. Sobel, Palo Alto, CA (US);
Daniel G. Gelb, Palo Alto, CA (US);
Andrew E. Fitzhugh, Palo Alto, CA (US);
Michael Harville, Palo Alto, CA (US);
Irwin E. Sobel, Palo Alto, CA (US);
Daniel G. Gelb, Palo Alto, CA (US);
Andrew E. Fitzhugh, Palo Alto, CA (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
A method includes determining a first blend map for a first projector, the first blend map including a first plurality of attenuation factors corresponding to a region of overlap between first and second images projected by the first projector and a second projector, respectively, on a display surface, applying the first blend map to a white level measurement map that includes a plurality of white level measurement values measured from a first plurality of captured images, applying a smoothing function to the white level measurement map to generate a white level target map, and determining a scale map for the first projector from the white level measurement map and the white level target map.