The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 2010
Filed:
Jun. 23, 2006
Tai-hung Lin, Pingtung Hsien, TW;
Chih-ming Chiang, Hsinchu Hsien, TW;
Yi-hsien Lee, Sinjhuang, TW;
Chi-ming Lee, Hsinchu, TW;
Tai-Hung Lin, Pingtung Hsien, TW;
Chih-Ming Chiang, Hsinchu Hsien, TW;
Yi-Hsien Lee, Sinjhuang, TW;
Chi-Ming Lee, Hsinchu, TW;
MediaTek Inc., , TW;
Abstract
An apparatus and method for testing an integrated circuit in a target electronic application, wherein the apparatus includes a socket for receiving the integrated circuit, a modified commercial electronic product which models the target electronic application, and an electrical connection between the socket and the modified commercial electronic product. The method of testing an integrated circuit includes placing an integrated circuit in a socket that is coupled to a circuit board substantially identical to that of a circuit board configured to include the integrated circuit, but which does not include the integrated circuit, and testing the integrated circuit. A method of making such a tester mechanically attaching a socket to a modified commercial electronic product and electrically connecting an integrated circuit and the modified commercial electronic product. This approach allows for cheaper, more comprehensive, and more accurate testing of an integrated circuit.