The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2010

Filed:

Mar. 13, 2008
Applicants:

David K. Mcelfresh, San Diego, CA (US);

Dan Vacar, San Diego, CA (US);

Robert H. Melanson, San Diego, CA (US);

Leoncio D. Lopez, Escondido, CA (US);

Inventors:

David K. McElfresh, San Diego, CA (US);

Dan Vacar, San Diego, CA (US);

Robert H. Melanson, San Diego, CA (US);

Leoncio D. Lopez, Escondido, CA (US);

Assignee:

Oracle America, Inc., Redwood City, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test system including a package with interconnect paths. The package may have electrical paths that are electrically connected by the interconnect paths. The electrically connected electrical paths may yield increased data without significantly increasing the required testing hardware.


Find Patent Forward Citations

McElfresh, David. (2010). Apparatus and method for testing electrical interconnects (U.S. Patent No. 7800385). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7800385

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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